Title: Combining (Polarised) Neutron and Synchrotron Scattering Methods for Investigations on Magnetic Thin Film Nanostructures

Speaker: Dr. Frank Klose

Time: 9:00 AM, May 29, 2013

Place: Room A415, IHEP Main Building

Abstract:

Magnetic thin film nanostructures are crucial to numerous applications in data storage and other electronic devices. This presentation will present striking examples which illustrate the usefulness of neutron and synchrotron scattering in magnetic thin film research. It can be extremely powerful to combine the analysis of element specific resonant x-ray scattering techniques and polarised neutron reflectivity/diffraction to produce a very detailed insight into the depth-dependent stoichiometry and magnetic profile of the thin film systems.

In this presentation, we will review our current activities in nanomagnetism research related to magnetic structure, exchange bias, biquadratic coupling and multiferroicity in metal, metal-oxide and rare earth nitride thin film systems. Key instruments for our research are the PLATYPUS polarised neutron reflectometer at the OPAL research reactor near Sydney which is able to detect in-plane magnetic moments on nanometer scale with depth-resolution as well as the triple-axis diffractometers TAIPAN and SIKA which are capable of detecting atomic scale ferro- and antiferromagnetic structures.

Combining the neutron scattering capabilities of OPAL with diffraction and spectroscopy methods available at the Australian Synchrotron provides tremendous scientific opportunities for the Asia-Oceania nanomagnetism and spintronic research community.