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Instrument

Multiple Purpose Reflectometer

Date: 2017-03-15

Performance:

1. Vertical sample geometry: solid film

2. Reflectivity/diffraction

3. Best resolution ΔQ/Q < 1%

4. Polarizing analysis for spinoelectronics

5. In-suit study on growing films

6. In-suit MOKE magnetic analysis Off-specular scattering

7. Grazing-incidence small-angle scattering

 

Specifications: 

Moderator CHM (20 K)
Bandwidth(Δλ) 6 Å
Guide 

Bender+Sraight+Taper

40 × 60 → 20 × 30 mm²

SS distance L1 19.5 m
SD distance L2 2 m
Sample table  Supermirror type
Polarizer/analyzer Supermirror type
Detector

2D position-sensitive detector

Position resolution: 2 mm

 

MR